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Breakthrough Measurement Technology Achieves 0.00004 mil Resolution
The SI Series Multi-Wavelength Displacement Sensor introduced by KEYENCE, with ultra-small 2mm diameter Micro-head
sensors, measures wavelength shifts of reflected multi-wavelength light. It measures height, thickness, vibration, rotation and high-speed
objects with 1nm / 0.00004 mil resolution. Operational simplicity and target tracking offer significant advantages over conventional sensors.
Up to 6 heads measure simultaneously with calculations and data point storage.
Details & specs. |